nanoandmore/HQ:NSC16/Cr-Au/HQ:NSC16/Cr-Au-15/Box of 15 AFM Probes

来自 : 发布时间：2025-04-27

Cantilever:

F: 190 kHz C: 45 N/m L: 225 µm

Applications:

Conductive AFM ProbesLife Science AFM Probes

Description:

These cantilevers with the high spring constant and the low resonant frequency (below 250 kHz) can be used in Tapping mode in SPM that has a low-frequency feedback loop. These cantilevers also fit SPM systems that do not support probes with short lever arms.Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°. Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever.

AFM Tip:

shape: Rotated

height: 15 µm (12 - 18 µm)*

radius:

full cone angle: 40°

AFM Cantilever:

shape: Beam

length: 225 µm

width: 37.5 µm

thickness: 7 µm

force constant: 45 N/m (30 - 70 N/m)*

resonance frequency: 190 kHz (170 - 210 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.