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nanoandmore/PtSi-NCH/PtSi-NCH-10/Box of 10 AFM Probes
来自 : 发布时间:2024-04-28

Cantilever:

F: 330 kHz C: 42 N/m L: 125 µm

Applications:

Conductive AFM ProbesPlatinum Silicide AFM Probes

Description:

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-NCH probes are suitable for C-AFM and Tunneling AFM.The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.The probe offers unique features:
  • platinum silicide coating with excellent conductivity and good wear-out behavior
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Platinum silicide on both sides of the cantilever.

AFM Tip:

  • shape: Standard
  • radius:
  • AFM Cantilever:

  • length: 125 µm (115 - 135 µm)*
  • width: 30 µm (22.5 - 37.5 µm)*
  • thickness: 4 µm (3 - 5 µm)*
  • force constant: 42 N/m (10 - 130 N/m)*
  • resonance frequency: 330 kHz (204 - 497 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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    发布于 : 2024-04-28 阅读()