nanoandmore/CONTPt/CONTPt-10/Box of 10 AFM Probes

来自 : 发布时间：2025-01-15

Cantilever:

F: 13 kHz C: 0.2 N/m L: 450 µm

Applications:

Conductive AFM Probes

Description:

NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this AFM tip offers an excellent tip radius of curvature. PtIr5 CoatingThe PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius:

AFM Cantilever:

shape: Beam

length: 450 µm (445 - 455 µm)*

width: 50 µm (45 - 55 µm)*

thickness: 2 µm (1.5 - 2.5 µm)*

force constant: 0.2 N/m (0.07 - 0.4 N/m)*

resonance frequency: 13 kHz (9 - 17 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.