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nanoandmore/CONT/CONT-20/Box of 20 AFM Probes
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发布时间：2025-01-29
Cantilever:
F: 13 kHz C: 0.2 N/m L: 450 µmApplications:
Contact Mode AFM ProbesDescription:
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature.
UncoatedAFM Tip:
AFM Cantilever:
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发布于 ： 2025-01-29
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