Cantilever:
F:50kHzC:5N/m
L:310µm
Applications:
Self-Sensing&Self-ActuatingAFMProbesDescription:
Novelself-sensingandself-actuating(-exciting)probefordynamicmodeAtomicForceMicroscopy(AFM)
Akiyama-Probeisbasedonaquartztuningforkcombinedwithamicromachinedcantilever.Thegreatadvantageofthisnovelprobeisthatonecanbenefitfromboththetuningfork"sextremelystableoscillationandthesiliconcantilever"sreasonablespringconstantwithoneprobe.
Akiyama-ProbeisequippedwithaspecialversionoftheNANOSENSORS™AdvancedTEC,ahigh-endsharpsilicontipandhasanexcellentimagingcapABIlityonvarioussampleswithdifferentproperties,whichisashighasthatofaconventionalopticalleversystem.
Akiyama-Proberequiresneitheropticaldetection,noranexternalshaker.Akiyama-Probeoccupiesonlyasmallvolumeabovethesample.Thesefeaturesmakeitveryattractiveforcreatinganewgenerationofscanningprobemicroscopy(SPM)instruments.