nanoandmore/CONTPt/CONTPt-10/Box of 10 AFM Probes
商品编号：
CONTPt-10
品牌：
NanoAndMore
市场价：
¥6173.86
美元价：
4749.12
产品分类：
引物与探针
公司分类：
Primer_Probe
联系Q Q：
3392242852
电话号码：
4000-520-616
电子邮箱：
info@ebiomall.com
商品介绍
Cantilever:
F: 13 kHzC: 0.2 N/m
L: 450 µm
Applications:
Conductive AFM ProbesDescription:
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this AFM tip offers an excellent tip radius of curvature.
PtIr5 Coating
The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.
The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.
The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.
The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.
AFM Tip:
AFM Cantilever:
品牌介绍
AFM 探针规格范围在 NanoAndMore 投资组合中1原子力显微镜提示曲率半径： 1 - 20000 纳米高度： 2 - 50 微米2 AFM 悬臂共振频率： 6 - 5000 kHz力常数： 0.01 - 2000 牛/米长度： 7 - 500 微米宽度： 0.8 - 120 微米厚度： 0.08 - 7 µm3支撑芯片（搬运）方面： 1.6 毫米 x 3.4 毫米* 上述属性范围以及 AFM 探针指南包括 NANOSENSORS™ 特殊开发列表 AFM 探针，这些 AFM 探针可能未列在 NanoAndMore 上的常规 AFM 探针范围内。如果您无法通过搜索字段找到您正在寻找的 AFM 探针，请与我们联系 - 我们将很乐意为您提供帮助！
