Cantilever:
F:190kHzC:48N/m
L:225µm
Applications:
ConductiveAFMProbesDescription:
ThenewPointProbe®Plus(PPP)combinesthewell-knownfeaturesoftheprovenPointProbe®seriessuchashighapplicationversatilityandcompatibilitywithmostcommercialSPMswithamorereproducIBLetiprADIusaswellasamoredefinedtipshape.Theminimizedvariationintipshapeprovidesmorereproducibleimages.
NANOSENSORS™ PPP-NCLprobesaredesignedfornon-contactmodeortappingmodeAFM(alsoknownas:attractiveordynamicmode).AsanalternativetoNANOSENSORS™ highfrequencynoncontacttype(NCH)theNCLtypeisoffered.Thistypeisrecommendedifthefeedbackloopofthemicroscopedoesnotaccepthighfrequencies(400kHz)orifthedetectionsystemneedsaminimumcantileverlength>125µm.Comparedtothehighfrequencynon-contacttypeNCHthemaximumscanningspeedisslightlyreduced.ThissensortypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.
Theprobeoffersuniquefeatures:
- metallicconductivityofthetip
- highmechanicalQ-factorforhighsensitivity
- precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
- compatiblewithPointProbe®PlusXY-AlignmentSeries