Cantilever:
F: 105 kHzC: 6.2 N/m
L: 225 µm
Applications:
Conductive AFM ProbesDiamond AFM Probes
Description:
NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.
The conductive diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the cantilever resulting in an unsurpassed hardness of the tip. The coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm.
The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.
