Cantilever:
F:335kHzC:45N/m
L:160µm
Applications:
ConductiveAFMProbesLifeScienceAFMProbes
Description:
NANOSENSORS™AdvancedTEC™NCAuAFMtipsaredesignedfornon-contactortappingmodeimaging.Theyfeatureatetrahedraltipthatprotrudesfromtheveryendofthecantilever.
ThisuniquefeatureallowsprecisepositioningandmakestheAdvancedTEC™theonlyAFMscanningprobeintheworldthatoffersREALTIPVISIBILITYFROMTOP,evenwhentheprobeistiltedduetoitsmountingontotheAFMhead.Thisfeaturemakesthemthepremiumchoiceforallapplicationswherethetiphastobeplacedexactlyonthepointofinterestand/orhastobevisIBLe(e.g.Nanomanipulation).
DuetotheirverysmallhalfconeanglesthetipsoftheAdvancedTEC™Seriesshowgreatperformanceonsamplesthathaveasmallpatternsizecombinedwithsteepsamplefeatures.
Theprobeoffersuniquefeatures:
- REALTIPVISIBILITYFROMTOP
- metallicconductivityofthetip
- highmechanicalQ-factorforhighsensitivity
- aspectratioofthelast1.5µmofthetip>4:1(fromfrontandside)
- tipshapeisdefinedbyrealcrystalplanesresultinginhighlyreproduciblegeometriesandextremelysmoothsurfaces
- highlydopedsinglecrystalsilicon(0.01-0.025Ohm*cm)
- rectangularcantileverwithtrapezoidalcrosssection
- holderdimensionsare1.6mmx3.4mm
Pleasenote:Wearatthetipcanoccurifoperatingincontact-,friction-orforcemodulationmodeorwhereitisnecessarytoconducthighcurrents.
Thetipsidecoatingenhancestheconductivityofthetipandallowselectricalcontacts.
Thedetectorsidecoatingenhancesthereflectivityofthelaserbeambyafactorofabout2andpreventslightfrominterferingwithinthecantilever.Thecoatingprocessisoptimizedforstresscompensationandwearresistance.
Thebendingofthecantileverduetostressislessthan3.5%ofthecantileverlength.