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商品详细nanoandmore/一体式/AIO-50/盒50个AFM探针
nanoandmore/一体式/AIO-50/盒50个AFM探针
nanoandmore/一体式/AIO-50/盒50个AFM探针
商品编号: AIO-50
品牌: NanoAndMore
市场价: ¥14479.92
美元价: 11138.40
产地: 美国(厂家直采)
公司:
产品分类: 引物与探针
公司分类: Primer_Probe
联系Q Q: 3392242852
电话号码: 4000-520-616
电子邮箱: info@ebiomall.com
商品介绍

Applications:

Force Modulation (FM) AFM Probes
Contact Mode AFM Probes
Non-Contact / Standard Tapping Mode AFM Probes
Non-Contact / Soft Tapping Mode AFM Probes

Description:

Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You do not need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

Consistent high quality at a lower price!

 

Uncoated

AFM Tip:

  • Rotated
  • 17 µm (15 - 19 µm)*
  • 15 µm (10 - 20 µm)*
  • < 10="" nm="">
  • 20°-25° front view, 25°-30° from side, 10° at the apex
  • AFM Cantilevers:

    Cantilever A - Contact Mode
  • Beam
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 0.2 N/m (0.04 - 0.7 N/m)*
  • 15 kHz (10 - 20 kHz)*
  • Cantilever B - Force Modulation
  • Beam
  • 210 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 2.7 N/m (0.4 - 10 N/m)*
  • 80 kHz (50 - 110 kHz)*
  • Cantilever C - Soft Tapping
  • Beam
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 7.4 N/m (1 - 29 N/m)*
  • 150 kHz (70 - 230 kHz)*
  • Cantilever D - Tapping Mode
  • Beam
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 40 N/m (7 - 160 N/m)*
  • 350 kHz (200 - 500 kHz)*
  • * typical range
    品牌介绍
    AFM 探针规格范围在 NanoAndMore 投资组合中1原子力显微镜提示曲率半径: 1 - 20000 纳米高度: 2 - 50 微米2 AFM 悬臂共振频率: 6 - 5000 kHz力常数: 0.01 - 2000 牛/米长度: 7 - 500 微米宽度: 0.8 - 120 微米厚度: 0.08 - 7 µm3支撑芯片(搬运)方面: 1.6 毫米 x 3.4 毫米* 上述属性范围以及 AFM 探针指南包括 NANOSENSORS™ 特殊开发列表 AFM 探针,这些 AFM 探针可能未列在 NanoAndMore 上的常规 AFM 探针范围内。如果您无法通过搜索字段找到您正在寻找的 AFM 探针,请与我们联系 - 我们将很乐意为您提供帮助!