Cantilever:
F:190kHzC:48N/m
L:225µm
Applications:
Non-Contact/StandardTappingModeAFMProbesDescription:
NanoWorldPointprobe®NCLprobesaredesignedfornon-contactortapping™modeimagingandofferanalternativetoourhighfrequencynon-contacttypeNCH.TheNCLtypeisrecommendedifthefeedbackloopofthemicroscopedoesnotaccepthighfrequenciesorifthedetectionsystemneedsaminimumcantileverlength(>125µm).ThisprobecombineshighoperationstABIlitywithoutstandingsensitivity.Comparedtothehighfrequencynon-contacttypeNCHthemaximumscanningspeedisslightlyreduced.
AllSPMandAFMprobesofthePointprobe®seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Thetipisshapedlikeapolygonbasedpyramid.
Additionally,thisprobeoffersanexcellenttiprADIusofcurvature.
ThisprobewassoldbyVeecoInstrumentsInc.forover10yearsupuntilApril2007.BrukerCorporation,whichacuiredVeecometrologybusiness,isnolongersellingtheoriginalprobewhichhasalwaysbeenmanufacturedbyNanoWorld®.