Cantilever:
F:190kHzC:48N/m
L:225µm
Applications:
Non-Contact/StandardTappingModeAFMProbesDescription:
ThenewPointProbe®Plus(PPP)combinesthewell-knownfeaturesoftheprovenPointProbe®seriessuchashighapplicationversatilityandcompatibilitywithmostcommercialSPMswithafurtherreducedandmorereproducIBLetiprADIusaswellasamoredefinedtipshape.Theexcellenttipradiusandtheminimizedvariationintipshapeprovidemorereproducibleimagesandenhancedresolution.
NANOSENSORS™PPP-NCLAFMprobesaredesignedfornon-contactmodeortappingmodeAFM(alsoknownas:attractiveordynamicmode).TheNCLtypeisofferedasanalternativetoNANOSENSORS™highfrequencynoncontacttype(NCH).PPP-NCLisrecommendedifthefeedbackloopofthemicroscopedoesnotaccepthighfrequencies(400kHz)orifthedetectionsystemneedsaminimumcantileverlength>125µm.Comparedtothehighfrequencynon-contacttypeNCHthemaximumscanningspeedisslightlyreduced.ThisprobetypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.
Theprobeoffersuniquefeatures:
- excellenttipradiusofcurvature
- highlydopedsilicontodissipatestaticcharge
- chemicallyinert
- highmechanicalQ-factorforhighsensitivity
- precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
- compatiblewithPointProbe®PlusXY-AlignmentSeries