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当前位置: 首页 > 产品中心 > Primer_Probe > NanoAndMore/PA01校准标准-NanoAndMore/PA01/NM
商品详细NanoAndMore/PA01校准标准-NanoAndMore/PA01/NM
MikroMasch HQ Line Test Structures: PA01 and HOPG thumb
NanoAndMore/PA01校准标准-NanoAndMore/PA01/NM
商品编号: PA01/NM
品牌: NanoAndMore
市场价: ¥3200.00
美元价: 2400.00
产地: 美国(厂家直采)
公司:
产品分类: 引物与探针
公司分类: Primer_Probe
联系Q Q: 3392242852
电话号码: 4000-520-616
电子邮箱: info@ebiomall.com
商品介绍
PA01Tip Evaluation SampleProduct Description

Sample for characterization of tip shape with hard sharp pyramidal nanostructures. The pyramids are triangular with base length in the range 50 – 100 nm and height 50 – 150 nm. The radius of curvature of the sharpest edges is below 5 nm.

The structures of the PA01 are covered by a highly wear-resistant layer.

  • pyramid base 50 - 100 nm
  • pyramid height 50 - 150 nm
  • smallest edge radii < 5 nm
  • active area 5 x 5 mm
  • chip dimensions 5 x 5 x 0.3 mm
  • available mounted on 12 mm metal plate (PA01) or unmounted (PA01/NM)
Application

The exact shape of the scanning probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to estimate the parameters of the tip. An AFM image of the PA structures is shown above. The AFM image is obtained using an OPUS240AC-NA probe.

品牌介绍
AFM 探针规格范围在 NanoAndMore 投资组合中1原子力显微镜提示曲率半径: 1 - 20000 纳米高度: 2 - 50 微米2 AFM 悬臂共振频率: 6 - 5000 kHz力常数: 0.01 - 2000 牛/米长度: 7 - 500 微米宽度: 0.8 - 120 微米厚度: 0.08 - 7 µm3支撑芯片(搬运)方面: 1.6 毫米 x 3.4 毫米* 上述属性范围以及 AFM 探针指南包括 NANOSENSORS™ 特殊开发列表 AFM 探针,这些 AFM 探针可能未列在 NanoAndMore 上的常规 AFM 探针范围内。如果您无法通过搜索字段找到您正在寻找的 AFM 探针,请与我们联系 - 我们将很乐意为您提供帮助!