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当前位置: 首页 > 产品中心 > Primer_Probe > 纳米和更多/TGF11校准标准-纳米和更多/TGF11/NM
商品详细纳米和更多/TGF11校准标准-纳米和更多/TGF11/NM
MikroMasch HQ Line Test Structures: TGF11 Calibration Series thumb
纳米和更多/TGF11校准标准-纳米和更多/TGF11/NM
商品编号: TGF11/NM
品牌: NanoAndMore
市场价: ¥4000.00
美元价: 2400.00
产地: 美国(厂家直采)
公司:
产品分类: 引物与探针
公司分类: Primer_Probe
联系Q Q: 3392242852
电话号码: 4000-520-616
电子邮箱: info@ebiomall.com
商品介绍
TGF11Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity AssessmentProduct Description

The TGF calibration gratings feature one-dimensional arrays of trapezoidal steps etched into a silicon substrate. The sidewalls of the structures are very smooth and planar surfaces with well-defined orientation formed by the (111) crystallographic planes in monocrystalline silicon. The sidewalls and the horizontal top surfaces form a well defined angle.

  • array pitch 10 µm, accuracy 0.1 µm
  • edge angle 54.74°
  • 3 x 3 mm
  • step height ~ 1 µm (approximate value, not for vertical calibration purposes)
  • chip dimensions 5 x 5 x 0.3 mm
ApplicationTGF11 grating can be used for the assessment of scanner nonlinearity in the vertical direction. Direct calibration of the lateral force can be obtained by analyzing the contact response measured on the flat and sloped facets. This can be done for the calibration of conventional Si probes or cantilevers with an attached colloidal particle with any radius of curvature up to 2 μm.
品牌介绍
AFM 探针规格范围在 NanoAndMore 投资组合中1原子力显微镜提示曲率半径: 1 - 20000 纳米高度: 2 - 50 微米2 AFM 悬臂共振频率: 6 - 5000 kHz力常数: 0.01 - 2000 牛/米长度: 7 - 500 微米宽度: 0.8 - 120 微米厚度: 0.08 - 7 µm3支撑芯片(搬运)方面: 1.6 毫米 x 3.4 毫米* 上述属性范围以及 AFM 探针指南包括 NANOSENSORS™ 特殊开发列表 AFM 探针,这些 AFM 探针可能未列在 NanoAndMore 上的常规 AFM 探针范围内。如果您无法通过搜索字段找到您正在寻找的 AFM 探针,请与我们联系 - 我们将很乐意为您提供帮助!